Download Atomic Force Microscopy in Process Engineering An by W. Richard Bowen PDF

By W. Richard Bowen

This can be the 1st publication to compile either the elemental concept and confirmed strategy engineering perform of AFM. it's provided in a manner that's obtainable and invaluable to training engineers in addition to to people who are enhancing their AFM talents and data, and to researchers who're constructing new items and recommendations utilizing AFM.
The e-book takes a rigorous and useful strategy that guarantees it really is without delay acceptable to approach engineering difficulties. basics and strategies are concisely defined, whereas particular merits for procedure engineering are essentially outlined and illustrated. Key content material comprises: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic strength microscopy (AFM) is a vital software for strategy engineers and scientists because it permits more desirable approaches and products
- the single ebook facing the speculation and functional functions of atomic strength microscopy in strategy engineering
- presents best-practice assistance and adventure on utilizing AFM for approach and product development

Show description

Read Online or Download Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Pro PDF

Best technique books

Woodworking Shopnotes 043 - Build Your Own Dovetail Jig

Each web page of ShopNotes journal will make you a greater woodworker, since you get extra woodworking plans, extra woodworking suggestions, extra woodworking jigs, and extra approximately woodworking instruments — and never a unmarried advert. For greater than 25 years, woodworkers have became to ShopNotes for the main exact woodworking plans and woodworking advice to be had wherever.

Methodologies and Software Engineering for Agent Systems

With expanding reputation of agent-based computing, loads of new examine concerning the id and definition of compatible versions, instruments, and methods to aid the improvement of complicated Multiagent platforms (MAS) has emerged. This examine, in most cases pointed out as Agent-Oriented software program Engineering (AOSE), constantly proposes new metaphors, new formal modeling methods and methods, and new improvement methodologies and instruments.

Additional resources for Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Pro

Example text

A. K. Hansma, Imaging adhesion forces and elasticity of lysozyme adsorbed on mica with the atomic force microscope, Langmuir 10 (1994) 3809–3814. [61] N. Chaiyut, T. Amornsakchai, S. Thanawan, Force volume imaging of defects in highly drawn high-density polyethylene, Polym. Test. 26 (2007) 396–401. [62] C. Rotsch, M. Radmacher, Mapping local electrostatic forces with the atomic force microscope, Langmuir 13 (1997) 2825–2832. [63] H. Hillborg, N. Tomczak, A. Olah, H. J. Vancso, Nanoscale hydrophobic recovery: a chemical force microscopy study of UV/ozone-treated cross-linked poly(dimethylsiloxan), Langmuir 20 (2004) 785–794.

Chiang, Atomic scale friction between the muscovite mica cleavage plane and a tungsten tip, J. Chem. Phys. 89 (8) (1988) 5190–5192. M. M. McClellamd, R. Erlandsson, S. Chiang, Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett. 59 (17) (1987) 1942–1946. [31] Y. Miyahara, T. Fujii, S. Watanabe, A. Tonoli, S. Carabelli, H. Yamada, H. Bleuler, Lead zirconate titanate cantilever for non-contact atomic force microscopy, Appl. Surf. Sci. 140 (1999) 428–431. H. Sorenson, U.

These include, in no especial order, the measurement of the dynamic response of cantilevers with colloidal spheres attached in a viscous fluid [110, 111]; calculating k of levers on a chip, based on geometry, compared with a lever on the same chip calibrated by another method [97]; an alternative ‘thermal method’ with k calculated from the resonant frequency, Q factor and the squared resonance amplitude [112]; and measuring the static deflection of an AFM cantilever due to a known end-loaded mass [113].

Download PDF sample

Rated 4.99 of 5 – based on 41 votes